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Tytuł

Data

Godzina

Wykładowca

USP 232/233 Elemental Impurities Analysis Part 3: Bring it all together with Hardware and Software Live Demo for USP analysis.

Jun 29, 2021

12:30pm PT/ 3:30pm ET

Bert Woods, Application Scientist, Agilent Technologies, Inc.; Ana Garcia-Gonzalez, Atomic Spectroscopy Applications Scientist, Agilent Technologies, Inc.; Abe Gutierrez, ICP-MS Product Specialist, Agilent Technologies, Inc.

Agilent Atomic Spectroscopy in Energy and Chemicals Part 1: Sample Preparation and Sample Introduction in ICP-OES, MP-AES, and ICP-MS

Jul 13, 2021

12:30pm PT/ 3:30pm ET

Jenny Nelson, PhD, Application Scientist, Agilent Technologies, Inc.; Yan Cheung, Applications Chemist, Agilent Technologies, Inc.; Mark Kelinske, Application Scientist, Agilent Technologies, Inc.

Agilent Atomic Spectroscopy in Energy and Chemicals Part 2: New and Existing ASTM Methods in ICP-OES, MP-AES, and ICP-MS

Jul 20, 2021

12:30pm PT/ 3:30pm ET

Jenny Nelson, PhD, Application Scientist, Agilent Technologies, Inc.; Yan Cheung, Applications Chemist, Agilent Technologies, Inc.; Mark Kelinske, Application Scientist, Agilent Technologies, Inc.

Agilent Atomic Spectroscopy in Energy and Chemicals Part 3: Energy and Chemical Applications in ICP-OES, MP-AES, and ICP-MS

Jul 27, 2021

12:30pm PT/ 3:30pm ET

Jenny Nelson, PhD, Application Scientist, Agilent Technologies, Inc.; Yan Cheung, Applications Chemist, Agilent Technologies, Inc.; Mark Kelinske, Application Scientist, Agilent Technologies, Inc.

Agilent Atomic Spectroscopy in Energy and Chemicals Part 4: ICP-OES and MP-AES Software and Hardware live demo

Aug 3, 2021

12:30pm PT/ 3:30pm ET

Jenny Nelson, PhD, Application Scientist, Agilent Technologies, Inc.; Yan Cheung, Applications Chemist, Agilent Technologies, Inc.; Mark Kelinske, Application Scientist, Agilent Technologies, Inc.

Agilent Atomic Spectroscopy in Energy and Chemicals Part 5: ICP-MS Software and Hardware live demo

Aug 10, 2021

12:30pm PT/ 3:30pm ET

Jenny Nelson, PhD, Application Scientist, Agilent Technologies, Inc.; Yan Cheung, Applications Chemist, Agilent Technologies, Inc.; Mark Kelinske, Application Scientist, Agilent Technologies, Inc.


Webinaria nagrane, dostępne w wersji offline:

USP 232/233 Elemental Impurities Analysis Part 2: The Compliance Toolbox - Tools to facilitate compliance and understanding FDA requirements, User responsibilities and Agilent solutions

USP 232/233 Elemental Impurities Analysis Part 1: Why USP and what laboratories need to be Ready and Successful

Food and Cannabis Elemental Analysis Part 3: Elemental Analysis, Putting it All Together – Agilent 7850 ICP-OMS with MassHunter 5.1 Live Demo & Agilent 5900 ICP-OES with ICP Expert Live Demo

Food and Cannabis Elemental Analysis Part 2: Elemental Sample Prep for the Food and Agriculture Lab - Optimizing Your System for High Matrix Samples

Food and Cannabis Elemental Analysis Part 1: Elemental Workflows in the Food and Cannabis Lab

Environmental Analysis via ICP-OES Part 3: Bring it all together with Data Analysis & Processing as well as Report Generation and Customization

Environmental Analysis via ICP-OES Part 2: Exploring QC Parameter Setup as well as Tips and Tricks for Measuring Tough Samples while Achieving the High Sensitivity

Environmental Analysis via ICP-OES Part 1: A dive into Sample Preparation and Digestion Techniques as well as Calibration Standard and QC Preparation for Trace Metal Analysis

Environmental Analysis with ICP-MS techniques Part 3: Let’s take a deep dive! Advanced environmental ICP-MS applications and tips and tricks on getting excellent analytical results

Environmental Analysis with ICP-MS techniques Part 2: See it to believe it! Bring it All Together, an ICP-MS software and hardware live demo

Environmental Analysis with ICP-MS techniques Part 1: Getting excellent results without the complexity! Introduction to EPA 200.8, EPA 6020 methods workflow in ICP-MS

Avoiding Double Charged Interferences on Single Quadrupole ICP-MS

Fast, Reliable Elemental Data in Organic Solvents with a Microwave Plasma Atomic Emission Spectrometer (MP-AES)

Uses of profiling trace metals in food with ICP-MS and Mass Profiler Professional (MPP)

Tips & Tricks to increase Productivity on ICP-OES

The Need for Speed: Improving Throughput and Reducing Maintenance in ICP-MS

Achieve better productivity in your elemental analysis: Switch from Flame Atomic Absorption (AAS) to MPAES

Effortless Trace Element Analysis: Avoid Common Time Traps with a Smart ICP-MS

The New Agilent ICP: Give us 17 Seconds and We'll save you Days of Method development Time and Double Your Productivity

From High Matrix to Low Levels: How to Handle Matrix Interferences on ICP-MS

Automate Method Development using a Smart ICP-OES

Analytical Plasma Fundamentals and the Impact on your Results

ICP-OES: Basic Tips and Tricks and Maintenance

The Analysis of Petroleum and Petroleum Products with an Agilent ICP-MS system

Low Level Arsenic Analysis using Microwave Plasma-Atomic Emission Spectrometer (MP-AES)

Geochemical Analysis at the Speed of Light with ICP-OES

Learn how to achieve ultimate sensitivity with advanced tuning on Triple Quadrupole ICP-MS (ICP-QQQ)

Discover how Microwave Plasma-Atomic Emission Spectrometer (MP-AES) offers superior workflow productivity over Flame Atomic Abs

Learn how the High Energy Hydrogen mode by ICP-MS can remove difficult interferences and provide low level Sulfur analysis.

Are Your ICP-OES Results Optimized? Discover how to simplify Method Development and Data Analysis on ICP-OES

Unearth the importance of Single Mass Resolution for MS/MS with Triple Quadrupole ICP-MS (ICP-QQQ)

Tips & Tricks to Ensure you are getting the Correct Results from your Flame Atomic Absorption

Take a deep dive with us and learn Advanced Tuning Tips and Tricks for Single Quadrupole ICP-MS

Learn how to Confirm your Data on ICP-OES. Are you getting the Right Result? Are You Sure?

How to Minimize Contamination and Carry Over Issues on ICP-MS

Discover an Automated Sample Screening that Intelligently Develops ICP-OES Methods

Removing Difficult Isobaric Overlaps using Triple Quadrupole ICP-MS (ICP-QQQ) is Simple: If you have MS/MS

Worry Less, Analyze More: How Advances in ICP-OES Sample Introduction Systems Can Reduce Downtime and Simplify Maintenance

How Can You Leverage SemiQuant Analysis on an ICP-OES System? Learn About All of the Capabilities of the Agilent ICP-OES

EPA 200.8 Water ICP-MS Analyzer – Learn How This Integrated Package Ensures Your Lab is Up and Running Samples Quickly

Are ICP-OES Interferences Giving You Concern? Learn How to Remove Spectral Interferences and Improve Accuracy on the Agilent ICP

Analysis of Single and Multielement Nanoparticles on the Agilent Triple Quadrupole ICP-MS with MS/MS

Lower Limits for Lead in Surface Wipes Testing are Coming - Is your lab ready?

Did You Know MassHunter Has a Custom Report Designer? Learn How to Setup Your Own Custom ICP-MS Reports Like a PRO!

Method Development Tips for ICP-OES: Wavelength Selection Considerations for Optimal Sensitivity and Linearity

Turbo-Charge Your Flame Atomic Absorption (AA) Productivity Using Rapid, Multielement Analysis

Speciation Made Simple with an Agilent ICP-MS

Know What’s in Your Sample Without Quantitative Analysis: The Benefits of Using SemiQuant Analysis on ICP-OES

Rapid Mulitelement Nanoparticle Analysis of Environmental Matrices by sNP-ICP-MS

IEC Implementation and Alternate Spectral Interference Techniques on the Agilent 5110 ICPOES

Learn How to Optimize Your Single Quadrupole ICP-MS to Obtain the Best Detection Limits with Challenging Elements

Get the Most Out of Your AA - Achieve the Productivity and Speed of Sequential ICP-OES with Agilent’s AA Systems

Minimize Carry Over and Contamination on Your Agilent ICP-MS

How to Optimize Your ICP-OES Sample Introduction System for Your Samples Type

No Standards, No Problem: Maximizing the Power of ICP-MS Using Semiquantitative Analysis

Agilent-patented Fast Sequential Flame AA – Kickstarting Your Elemental Analysis without the high cost of Argon

Get the most out of your ICP-OES: Tips & Tricks to increase Productivity

Learn how to get the most out of your ICP-MS: Tips and Tricks on ICP-MS Maintenance

Get the Most out of your AA/MP by learning to Optimize each technique for your application

Measuring Nanoparticles in the Environment on your Agilent 7900 ICP-MS

Determination of the Geographic Origin of Spices Using ICP-OES, ICP-MS, and Mass Profile Professional

Optimizing your ICPOES for analysis of Brine Solutions

ICPGO – Fast, Easy, GO! – Elemental Analysis Made Easy

Analysis of Hg, As and Se by Hydride Generation using the Agilent 4210 MP-AES and the Multi-mode Sample Introduction System

Automated Organic Analyses on an Agilent 7900 ICP-MS

Method Development and Data Interpretation on Agilent's 5110 ICP-OES

ICP Flow Injection Analysis: Applications and Optimization of the AVS 7

ICP-MS Maintenance, Tips and Tricks

Issues and Troubleshooting for Organic ICP-OES Analysis: Petrochemical Market Segment Focus

The Analysis of Single and Multiple Element Nanoparticles on the Agilent 8900 ICP-MS/MS

The Analysis of Glycols and Coolants Using ICP-OES

Elemental Speciation Techniques By HPLC-ICP-MS

What’s in That Sample? Using Intelliquant On The 5110 ICP-OES

Resolving Interferences in Organic Solvents Using the Agilent 8900 ICP-MS/MS

Boost the Performance of Your ICP-OES With High-Speed AVS7 Switching Valve

Analysis of Drinking & Waste Water Samples with Minimal Prep Time and Optimal Sample Throughput

Analysis of Trace Elements in Neat Volatile Solvents Using the Agilent 5110 ICP-OES

Tuning Your ICP-MS Instrument for Excellent Sensitivity and Long-Term Stability

ICP-MS Troubleshooting and Maintenance

A Follow-Up to Speciation Made Simple: Let's Dive into the Advanced Speciation Software Capabilities!

ICP-OES Troubleshooting and Maintenance

Lower the Detection Limits On ICP-OES Using Some Simple Tricks

Increasing Sample Throughput on The Agilent ICP-MS Portfolio

What Internal Standards In AA? How Can That Be? Autodilution Too? We've Got Both On Agilent Flame AAs With Fast Sequential And SIPS!

The Importance of Single Mass Resolution When Using MS/MS Technology Via the Agilent 8900 ICP-MS/MS

Interference Correction Techniques for the Analysis of Trace Metals in Alloys using Agilent 5110 ICP-OES

Advances to Inorganic Mass Spectrometry with MS/MS Technology

Geographic Fingerprinting of Whiskey using the Agilent 5110 ICP-OES and Mass Profiler Pro (MPP) Software

Essential Preventative Maintenance for Agilent ICP-MS

ICP-OES Method/Instrument Optimization

Speciation made Simple with an Agilent ICP-MS

Use of 5110 ICP-OES with AVS7 for High Throughput Wear Metals Analysis – Preparation Techniques

Demystifying USP<232>/<233> and ICH Q3D analysis with an Agilent ICP-MS

Demystifying USP<232>/<233> and ICH Q3D analysis with an Agilent ICP-OES

ICP-MS ASTM D8110-17 Method

Increased Productivity on 200.7 Analysis using the Agilent 5110 ICP-OES with Integrated AVS7 Switching Valve

Emerging Applications in the Semiconductor Industry by ICP-MS

Trace Metals Analysis for Environmental Applications by ICP-MS

AA Troubleshooting and Maintenance

Advancing Elemental Determinations in Food and Geological Samples with the Next Generation MP-AES Technology

Raise Your Expectations; learn how the new Agilent 7900 ICP-MS redefines ICP-MS performance

 

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